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Comparison of IGBT Junction Temperature Measurement Methods Based on Vth and Vce

Release date:2022-06-06  Number of views:3063   Amount of downloads:1389   DOI:10.19457/j.1001-2095.dqcd22721

      Abstract: The Vce method and the Vth method are two recommended junction temperature measurement methods in the IGBT thermal resistance test standard. However,the relationship and equivalence of the junction temperature measured by the two methods are not explained. Firstly,the voltage composition of Vce and Vth was theoretically analyzed,which shows that the junction temperature measured by the Vce method reflects the temperature information on the collector side,and the junction temperature measured by the Vth method reflects the temperature information on the emitter side. Due to the vertical temperature gradient inside the chip,it is inferred that the junction temperature measured by the Vth method will be higher than that by the Vce method. Then,according to the measurement principles of the two methods,an IGBT junction temperature measurement platform was built,and the junction temperature was measured by two methods under different load currents. The experimental results verify the theoretical prediction,and the junction temperature difference between the two methods increases as the load current increases. Finally,a simple thermal calibration model was proposed to quickly calculate the difference,so that the results of the two methods could be equivalently transformed and fairly compared.


      Key words: IGBT module;junction temperature measurement;Vce method;Vth method




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